ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an EDA method/technology used to find an input or test sequence. When applied to a digital circuit, ATPG enables ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...