HISTORICAL BACKGROUND: X-ray spectroscopy -- Electron microscopy -- The electron probe concept -- Development of a variety of instruments -- Electron probe philosophies -- Future operators of electron ...
Electron beam microanalysis comprises a suite of nondestructive methods that employ a focussed electron probe to induce characteristic X-ray or emitted electrons from a material, yielding quantitative ...
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
ELECTRON probe X-ray microanalysis permits the determination on a micro-scale of local distribution and concentration of elements in a sample. In a preliminary enquiry, the tests of calcareous ...
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