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Image data fusion of SIMS and TOF-SIMS with a high spatial resolution is helpful to obtain a clearer score image by PCA. An image data fusion of SIMS and TOF-SMS in high spatial and mass resolution ...
ION TOF. TOF-SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This equipment is engineered for the ...
To understand the important physical and chemical properties of nanostructured systems, it is essential to know their 3D chemical composition. This requires answering three central questions: 1. Which ...
ToF-SIMS was used to recognize a foreign crystalline material, which was detected in a drug solution after storage. There existed just a microscopic amount of crystallite, inadequate for bulk ...
Editor’s note: An open house is planned at the University of Delaware’s Surface Analysis Facility, located in Lammot du Pont Laboratory on UD’s Newark campus Friday, Sept. 23, from noon to 2 p.m. The ...
David J Scurr and Matthew Piggott describe how time-of-flight secondary ion mass spectrometry is helping scientists in a variety of industries to understand problems related to materials science ...
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